Pseudo labeling (PL) is a wide-applied strategy to enlarge the labeled dataset by self-annotating the potential samples during the training process. Several works have shown that it can improve the graph learning model performance in general. However, we notice that the incorrect labels can be fatal to the graph training process. Inappropriate PL may result in the performance degrading, especially on graph data where the noise can propagate. Surprisingly, the corresponding error is seldom theoretically analyzed in the literature.

Pseudo labeling (PL) is a wide-applied strategy to enlarge the labeled dataset by self-annotating the potential samples during the training process.

Pseudo labeling (PL) is a wide-applied strategy to enlarge the labeled dataset by self-annotating the potential samples during the training process. Several works have shown that it can improve the graph learning model performance in general. However, we notice that the incorrect labels can be fatal to the graph training process. Inappropriate PL may result in the performance degrading, especially on graph data where the noise can propagate. Surprisingly, the corresponding error is seldom theoretically analyzed in the literature. In this paper, we aim to give deep insights of PL on graph learning models. We first present the error analysis of PL strategy by showing that the error is bounded by the confidence of PL threshold and consistency of multi-view prediction. Then, we theoretically illustrate the effect of PL on convergence property. Based on the analysis, we propose a cautious pseudo labeling methodology in which we pseudo label the samples with highest confidence and multi-view consistency. Finally, extensive experiments demonstrate that the proposed strategy improves graph learning process and outperforms other PL strategies on link prediction and node classification tasks.

Partial-label learning (PLL) generally focuses on inducing a noise-tolerant multi-class classifier by training on overly-annotated samples, each of which is annotated with a set of labels, but only one is the valid label. A basic promise of existing PLL solutions is that there are sufficient partial-label (PL) samples for training. However, it is more common than not to have just few PL samples at hand when dealing with new tasks. Furthermore, existing few-shot learning algorithms assume precise labels of the support set; as such, irrelevant labels may seriously mislead the meta-learner and thus lead to a compromised performance. How to enable PLL under a few-shot learning setting is an important problem, but not yet well studied. In this paper, we introduce an approach called FsPLL (Few-shot PLL). FsPLL first performs adaptive distance metric learning by an embedding network and rectifying prototypes on the tasks previously encountered. Next, it calculates the prototype of each class of a new task in the embedding network. An unseen example can then be classified via its distance to each prototype. Experimental results on widely-used few-shot datasets (Omniglot and miniImageNet) demonstrate that our FsPLL can achieve a superior performance than the state-of-the-art methods across different settings, and it needs fewer samples for quickly adapting to new tasks.